Wafer AVI

Wafer AVI is used to detect various defects of semiconductor wafers in the process of manufacturing. Through multi-station optical imaging settings, the corresponding size and defect problems are respectively detected to ensure full coverage of defects. Combined with a variety of detection algorithms, it ensures good detection results and achieves better stable applications.

Advantages

Rising UPH

Multiple imaging techniques, high precision, and effective detection, the great improvement of UPH

Double Effectiveness

Integration of multiple detection algorithms, far exceeding the effect of traditional equipment

Stability

High precision equipment, stable operation, and detection

Manual Re-evaluation

Corresponding manual re-evaluation devices can be imported to improve the effect

Technical Services

Full technology service support, continuous upgrade

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